Leo H. Chiang is Technology Director at Dow Inc., leading Chemometrics and AI implementations for Manufacturing. Leo has developed and implemented several data analytics techniques to solve complex manufacturing problems, resulting in 11 Dow Manufacturing Technology Center Awards. In 2016 he received the Dow R&D Excellence in Science Award in recognition of his scientific achievement in industrial research. Leo has a B.S. degree from University of Wisconsin at Madison and M.S. and Ph.D. degrees from the University of Illinois at Urbana-Champaign, all in Chemical Engineering. Leo has contributed to over 40 externally refereed journal/proceedings papers and has given over 100 conference presentations and university lectures. Leo has co-authored two books published by Springer Verlag. His textbook Fault Detection and Diagnosis in Industrial Systems is available in English and Chinese and has received over 2,100 citations according to Google Scholar. Leo has a long history of supporting American Institute of Chemical Engineers (AIChE), having served as 2014-2016 Computing and Systems Technology (CAST) director, 2016 CAST 10E programming chair, 2017-2018 spring meeting program chair (MPC), and recently elected to serve the 2019-2022 Executive Board of the Program Committee (EBPC). Leo was instrumental in setting up the Big Data Analytics Topical Conference (2015 to 2017) and Industry 4.0 Topical Conference (2018-2020) at the AIChE spring meeting. He was recognized by the AIChE with the 2016 Herbert Epstein Award for his leadership on Big Data Analytics technical programming and 2016 Computing Practice Award for his world-class leadership in the development and application of methodologies in analytics for batch and continuous processes known as Big Data. Leo is also active in the broader engineering and control community, currently serves as 2019-2021 Computer Aids for Chemical Engineering (CACHE) trustee, 2021 International Symposium on Advanced Control of Chemical Processes (ADCHEM) industry co-chair, and 2022 American Control Conference (ACC) vice chair for industrial applications.